Measurement technology and intelligent instruments : 29 October-5 November 1993, Wuhan, China /
| Corporate Authors: | , |
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| Other Authors: | |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Bellingham, Washington :
SPIE,
1993
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
Volume 2101 |
| Subjects: |
Internet
This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.Duke University
| Call Number: |
ISIL:US-NCD |
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