Microscopic x-ray fluorescence analysis /

"In the last 10-15 years many analytical advances in X-ray fluorescence analysis (XRF) have taken place, giving rise to non-destructive ultrasensitive surface analyses of materials. One of the variants of XRF developed is micro-XRF ([mu]-XRF), which is able to analyse the distribution of major,...

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Bibliographic Details
Other Authors: Adams, F (Freddy), 1938-, Janssens, Koen H. A, Rindby, Anders
Format: Book
Language:English
Published: Chichester ; New York : Wiley, 2000
Subjects:

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Stanford University

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Call Number: ISIL:US-CST
QD96 .M53 2000

Massachusetts Institute of Technology

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Johns Hopkins University

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Duke University

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Columbia University

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Call Number: QD96 .M53 2000