2nd IEEE International Workshop on Metrology for Aerospace : proceedings : Benevento, Italy, June 3-5 2015 /

2nd IEEE International Workshop on Metrology for Aerospace : proceedings : Benevento, Italy, June 3-5 2015 /

Bibliographic Details
Corporate Authors: IEEE International Workshop on Metrology for Aerospace Benevento, Italy, IEEE Aerospace and Electronic Systems Society (sponsoring body), IEEE Instrumentation and Measurement Society (sponsoring body), Institute of Electrical and Electronics Engineers (sponsoring body,)
Format: Conference Proceeding Manuscript Book
Language:English
Published: [Piscataway, New Jersey] : IEEE, [2015]
Subjects:
Aeronautics > Congresses
Metrology > Congresses
Conference papers and proceedings

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Stanford University

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