Atom Probe Microscopy /
Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and puls...
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| Other Authors: | , , |
| Format: | Book |
| Language: | English |
| Published: |
New York, NY :
Springer New York : Imprint: Springer,
2012
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| Series: | Springer series in materials science ;
160 |
| Subjects: |
Internet
This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.Harvard University
| Call Number: |
QH212.A78 A866 2012 |
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