Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China /

Bibliographic Details
Corporate Author: International Conference on Measurement, Instrumentation and Automation Shanghai, China
Other Authors: Kim, Yun-Hae (Editor), Yarlagadda, Prasad (Editor)
Format: Conference Proceeding Book
Language:English
Published: Zurich, Switzerland : TTP, 2014
Series:Applied mechanics and materials ; Volume 568-570
Subjects:

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