Electron and ion microscopy and microanalysis : principles and applications /
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
New York :
M. Dekker,
1991
New York : [1991], ©1991 New York : c1991 New York : c1991 New York : 1991 |
| Edition: | 2nd ed., rev. and expanded |
| Series: | Optical engineering (Marcel Dekker, Inc.) ;
v. 29 Optical engineering (Marcel Dekker, Inc.) v. 29 |
| Subjects: |
Internet
Stanford University
| Call Number: |
ISIL:US-CST QH212 .E4 M87 1991 |
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University of Chicago
| Call Number: |
QH212.E4M870 1991 |
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Johns Hopkins University
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QH 212 .E4 M871 1991 |
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Duke University
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QH212.E4 M87 1991 |
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Cornell University
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QH212.E4 M97 1991 |
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| Call Number: |
QH212.E4 M87 1991 |
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University of Pennsylvania
| Call Number: |
QH212.E4 M87 1991 |
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Brown University
| Call Number: |
1-SIZE QH212.E4 M87 1991 |
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