Atom probe microscopy /
Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and puls...
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| Format: | Book |
| Language: | English |
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New York :
Springer,
c2012
New York : ©2012 |
| Series: | Springer series in materials science ;
160 |
| Subjects: |
Internet
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