In-process optical measurements and industrial methods : ECO3, 14-15 March 1990, the Hague, the Netherlands /
| Corporate Authors: | , , , , |
|---|---|
| Other Authors: | , |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
c1990
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 1266 |
| Subjects: |