High temperature strain measurement with a resistance strain gage [microform] /

High temperature strain measurement with a resistance strain gage [microform] /

Bibliographic Details
Main Author: Lei, Jih-Fen
Corporate Author: United States National Aeronautics and Space Administration
Other Authors: Fichtel, Edward J, McDaniel, Amos D
Format: Government Document Book
Language:English
Published: [Washington, DC] : [Springfield, Va. : National Aeronautics and Space Administration ; National Technical Information Service, distributor, 1993]
Series:NASA contractor report NASA CR-194441
Subjects:
High temperatures
Strains and stresses

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Stanford University

Holdings details from Stanford University
Call Number: ISIL:US-CST
MARCIVE
NAS 1.26:194441

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