GaAs HBT and HEMT technologies for Agilent Instruments

An outline of the HBT and HEMT process technologies including performance and reliability results are presented. Also, several circuit examples and their contributions to instruments are described

Bibliographic Details
Corporate Author: Massachusetts Institute of Technology Microsystems Technology Laboratories
Other Authors: D'Avanzo, Don
Format: Unknown
Language:English
Published: [Cambridge, Mass.] : MIT Microsystems Technology Laboratories, [2000]
Series:MTL VLSI seminar
Subjects:

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Massachusetts Institute of Technology

Holdings details from Massachusetts Institute of Technology
Call Number: VIDEO TK7874.75.M37 2000-4