Methods of measurement for semiconductor materials, process control, and devices; quarterly report

Methods of measurement for semiconductor materials, process control, and devices; quarterly report

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Bibliographic Details
New Title:Institute for Applied Technology (U.S.). Electronic Technology Division Semiconductor measurement technology: quarterly report
Corporate Author: United States National Bureau of Standards
Format: Government Document Serial
Language:English
Published: [Washington, For sale by the Supt. of Docs., U.S. Govt. Print. Off.]
[Washington] : [For sale by the Supt. of Docs., U.S. Govt. Print. Off]
Series:NBS technical note
NBS technical note 472
NBS technical note 475
NBS technical note 488
NBS technical note 495
NBS technical note 520
NBS technical note 527
NBS technical note 555
NBS technical note 560
NBS technical note 571
NBS technical note 592
NBS technical note 598
NBS technical note 702
NBS technical note 717
NBS technical note 727
NBS technical note 733
NBS technical note 743
NBS technical note 754
NBS technical note 773
NBS technical note 788
NBS technical note 806
Subjects:
Semiconductors > Periodicals > ^A2535340
Semiconductors > Periodicals
Semiconductors
Periodicals > ^A3353385
Periodicals

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Stanford University

Holdings details from Stanford University
Call Number: C 13.46:
C 13.46:472,475
C 13.46:488
C 13.46:495
C 13.46:520
C 13.46:527
C 13.46:555,560
C 13.46:571
C 13.46:592
C 13.46:598
C 13.46:702-703,705-708
C 13.46:717
C 13.46:727,733
C 13.46:743
C 13.46:754-767
C 13.46:773
C 13.46:788
C 13.46:806

Princeton University

Holdings details from Princeton University
Call Number: 9280.921

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