X-ray optics and microanalysis : proceedings of the 21st international congress, Campinas, Brazil, 5-9 September 2011 /
| Corporate Author: | |
|---|---|
| Other Authors: | , |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Melville, N.Y. :
American Institute of Physics,
2012
|
| Series: | AIP conference proceedings ;
no. 1437 |
| Subjects: |