Effect of 40-MEV protons on semiconductors as determined with an improved method of measuring diffusion length of minority carriers /
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| Format: | Book |
| Language: | English |
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Washington, D.C. :
National Aeronautics and Space Administration : [For sale by the National Technical Information Service, Springfield, Virginia 22151],
1965
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| Series: | NASA technical note ;
2817 NASA technical note ; D-2817 |
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