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Padilla, J. Moisés (José Moisées) (José Moisées)
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Padilla, J. Moisés (José Moisées) (José Moisées)
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Fringe pattern analysis for optical metrology : theory, algorithms, and applications /
by
Servín, Manuel
,
Padilla
,
J
.
Moisés
(
José
Moisées
) (
José
Moisées
)
,
Padilla, J. Moisés (José Moisés)
,
Quiroga, J. Antonio (Juan Antonio)
Published 2014
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Related Subjects
Diffraction patterns
Interferometry
Mathematical models
Metrology
Optical measurements
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