Showing 1 - 20 results of 49 for search '', query time: 0.14s Refine Results
  1. 1
    Proceedings of a Symposium on Accuracy in Powder Diffraction held at the National Bureau of Standards, Gaithersburg, Maryland, June 11-15, 1979 /
    Published 1980

    Government Document Conference Proceeding Book
  2. 2
    Standard X-ray diffraction powder patterns
    Published 1980

    Government Document Book
  3. 3
    Standard x-ray diffraction powder patterns
    Published 1981

    Government Document Book
  4. 4
    Standard X-ray diffraction powder patterns
    Published 1962

    Government Document Book
  5. 5
    Standard X-ray diffraction powder patterns
    Published 1963

    Government Document Book
  6. 6
    Standard X-ray diffraction powder patterns

    Government Document Book
  7. 7
    Standard X-ray diffraction powder patterns
    Published 1964

    Government Document Book
  8. 8
    Standard X-ray diffraction powder patterns
    Published 1970

    Government Document Book
  9. 9
    Standard X-ray diffraction powder patterns
    Published 1968

    Government Document Book
  10. 10
    Standard X-ray diffraction powder patterns
    Published 1967

    Government Document Book
  11. 11
    Standard X-ray diffraction powder patterns
    Published 1969

    Government Document Book
  12. 12
    A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films /
    by McCrackin, Frank L
    Published 1964

    This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.
    Government Document Book
  13. 13
    A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films /
    by McCrackin, Frank L
    Published 1964

    Government Document Book
  14. 14
    Infrared reflectances of metals at cryogenic temperatures : a compilation from the literature /
    by Dickson, Philip F., 1936-
    Published 1966

    Government Document Book
  15. 15
    A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films /
    by McCrackin, F. L (Frank L.)
    Published 1964

    This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.
    Government Document Book
  16. 16
    A measurement method for determining the optical and electro-optical properties of a thin film /

    Government Document Book
  17. 17
    Standard x-ray diffraction powder patterns
    Published 1985

    Government Document Book
  18. 18
    Standard X-ray diffraction powder patterns
    Published 1980

    Government Document Book
  19. 19
    Standard x-ray diffraction powder patterns
    Published 1981

    Government Document Book
  20. 20
    Standard X-ray diffraction powder patterns
    Published 1971

    Government Document Book
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