Elastic Field Surrounding a Rapidly Tearing Crack /

The transient elastic stress field surrounding a rapidly tearing crack in a single-edged notch (SEN) specimen is analyzed by dynamic photoelasticity using a 16-spark gap Cranz-Schardin camera system. The 1.6-mm-thick annealed polycarbonate SEN specimens produced rapidly tearing cracks with approxima...

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Bibliographic Details
Main Authors: Kobayashi, AS (Author), Lee, OS (Author)
Corporate Authors: ASTM International, American Society for Testing and Materials
Format: Book
Language:English
Published: West Conshohocken, Pa. : ASTM International, 1983
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Description
Summary:The transient elastic stress field surrounding a rapidly tearing crack in a single-edged notch (SEN) specimen is analyzed by dynamic photoelasticity using a 16-spark gap Cranz-Schardin camera system. The 1.6-mm-thick annealed polycarbonate SEN specimens produced rapidly tearing cracks with approximately 11-mm-long necked regions which were modeled as Dugdale strip yield zones. In addition, the wake of the residual compressive stress along the rapidly tearing crack was modeled statically by a single force parallel to the crack and acting close to the physical crack tip. Theoretical isochromatics generated by this residual-stress-corrected, propagating Dugdale model of a rapidly tearing crack agreed reasonably well with those obtained experimentally by dynamic photoelasticity
Physical Description:1 online resource (18 pages) : illustrations, figures, tables
Bibliography:Includes bibliographical references
Access:Restricted for use by site license.