Quantitative characterization of nanostructured materials : April 25-29, 2011, San Francisco, California, USA /
| Corporate Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Warrendale, Pa. : Cambridge ; New York :
Materials Research Society ; Cambridge University Press,
©2011
|
| Series: | Materials Research Society symposia proceedings ;
v. 1349 |
| Subjects: |
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Published 2011
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