Quantitative characterization of nanostructured materials : April 25-29, 2011, San Francisco, California, USA /
Corporate Authors: | , |
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Other Authors: | |
Format: | Conference Proceeding Book |
Language: | English |
Published: |
Warrendale, Pa. : Cambridge ; New York :
Materials Research Society ; Cambridge University Press,
©2011
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Series: | Materials Research Society symposia proceedings ;
v. 1349 |
Subjects: |
Item Description: | Symposium DD "2011 MRS Spring Meeting"--Cover |
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Physical Description: | 1 online resource (49 pages) : illustrations |
Bibliography: | Includes bibliographical references |