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120131s2012 nyua b 001 0 eng d |
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|a 1461434351
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|a 9781461434351
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|a (NcD)005453183DUK01
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|a QH212.A78
|b A866 2012
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| 072 |
|
7 |
|a TA
|2 lcco
|
| 245 |
0 |
0 |
|a Atom probe microscopy /
|c Baptiste Gault ... [et al.]
|
| 260 |
|
|
|a New York :
|b Springer,
|c c2012
|
| 300 |
|
|
|a xxiii, 396 p. :
|b ill. (some col.) ;
|c 24 cm
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a unmediated
|b n
|2 rdamedia
|
| 338 |
|
|
|a volume
|b nc
|2 rdacarrier
|
| 490 |
1 |
|
|a Springer series in materials science ;
|v 160
|
| 504 |
|
|
|a Includes bibliographical references and index
|
| 650 |
|
0 |
|a Atom-probe field ion microscopy
|
| 650 |
|
0 |
|a Atomic force microscopy
|
| 650 |
|
0 |
|a Scanning probe microscopy
|
| 700 |
1 |
|
|a Gault, Baptiste
|
| 830 |
|
0 |
|a Springer series in materials science ;
|v v. 160
|
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